Sample Introduction Techniques for Atomic ... - ACS Publications

School of Chemistry. Georgia Institute of Technology. Atlanta, Ga. 30332. Andrew W. Boorn. Sciex. 55 Glen Cameron Road, #202. Thornhill, Ontario L3T1P...
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Instrumentation Richard F. Browner School of Chemistry Georgia Institute of Technology Atlanta, Ga. 30332

Andrew W. Boorn Sciex 55 Glen Cameron Road, #202 Thornhill, Ontario L3T 1P2, Canada

Sample Introduction Techniques for Atomic Spectroscopy Selection of the best sample introduction procedure for an analysis requires consideration of a number of points. These include: • the type of sample (e.g., solid, liquid, gas), • the levels, and also the range of levels for the elements to be determined, • the accuracy required, • the precision required, • t h e a m o u n t of material available, • t h e number of determinations required per hour, and • special requirements, such as whether speciation information is needed. T h e measurement techniques available, whether flame atomic absorption spectroscopy (FAAS), inductively coupled plasma (ICP) atomic emission spectroscopy, or dc plasma (DCP) atomic emission spectroscopy, will also have a major effect on the choice of t h e procedure selected. Although this paper will concent r a t e specifically on sample introduction techniques, in any real analysis sample introduction is an extension of sample preparation. As a consequence, t h e selection of a suitable sample introduction technique can depend heavily on available and effective sample preparation procedures. Generally, though, sample preparation will not be discussed here, except where sample introduction and sample preparation are intimately linked. 0003-2700/84/0351-875A$01.50/0 © 1984 American Chemical Society

T o u n d e r s t a n d the limitations of practical sample introduction systems it is necessary to reverse the normal train of thought, which tends to flow in t h e direction of sample solutionnebulizer-spray chamber-atomizer, a n d consider the sequence from the opposite direction. Looking a t sample introduction from the viewpoint of the atomizer, t h e choice of procedure will hinge on what t h e atomizer can usefully accept. Bearing in mind t h a t every atomizer has certain reasonably well defined, b u t different, properties of t e m p e r a t u r e , chemical composition etc., an introduction procedure must be selected t h a t will result in rapid breakdown of species in the atomizer, irrespective of the sample matrix. T o ensure efficient free atom production, the following parameters m u s t be known for each analyte-matrix-atomizer combination: • m a x i m u m acceptable drop size, • o p t i m u m solvent loading, both aerosol and vapor, • m a x i m u m acceptable analyte mass loading, • appropriate gas flow p a t t e r n s for effective plasma penetration (for the ICP), and • suitable observation height. T h i s last parameter should be selected in conjunction with the gas flow p a t t e r n of sample introduction such

t h a t a d e q u a t e residence time is provided for t h e introduced material to desolvate, vaporize, and atomize. In certain cases, for instance, when organic solvents are introduced to an ICP, it also may be necessary to adjust t h e atomizer operating characteristics to account for the change in plasma properties induced by t h e solvent. Here, an increase m forward power to t h e plasma (e.g., from 1.25 to 1.75 kW) is necessary to aid the decomposition of organic species. Overall, then, it is the properties of t h e atomizer t h a t dictate the design a n d operation of the sample introduction system. This is particularly true for liquid sample introduction with p n e u m a t i c nebulization.

Present Understanding of Sample Introduction Processes T h e r e is a great deal of intuitive, b u t relatively little experimentally based, knowledge in this field. Clearly, t h e r e is some upper limit to the size of d r o p t h a t can be vaporized in the typically 1-2 ms available in the atomizer. Yet there are no tables available t h a t specify the upper limit of drop size suitable for each matrix and atomizer. Such tables would be of great help to

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practicing analytical chemists. Of course, the production of these tables is not a trivial matter, and would re­ quire rather involved experimental procedures at the state of the art in particle generation and characteriza­ tion. Nevertheless, when these data do become available, which undoubtedly they will in due time, this should allow researchers to steer around the major­ ity of interference problems other than those of spectral overlaps, for which tabular data are already avail­ able (i, 2). ICP Systems. The data available on solvent-loading limitations for or­ ganic solvents with the ICP have been characterized recently (3). Some typi­ cal limiting aspiration rates are shown in Table I, together with evaporation factors, E, of the solvents. These data are useful as a guide for organic sol­ vent introduction to the ICP. The evaporation factor is a measure of the rate of mass loss from an evaporating drop, and is given by: Ε = 48 DvaPsM2(5RT)-2

(1)

where Dv is the diffusion coefficient of the solvent vapor, σ is the surface ten­ sion, Ps is the saturated vapor pres­ sure, M is the molecular weight of the solvent, δ is the density, R is the gas constant, and Τ is the absolute tem­ perature. In general, the ICP has de­ creasing tolerance to solvents as their evaporation factors increase, and there is an inverse correlation between evaporation factor and limiting aspi­ ration rate. However, the alcohols have a much greater quenching effect on the plasma than their evaporation factors would indicate, and they may readily extinguish the plasma under normal operating conditions. It is always possible to remove at least part of the solvent vapor by con­ densation. Two groups of workers have attempted this and shown that the tolerance of the ICP to organic sol­ vents is greatly improved when a large fraction of the solvent vapor is re­ moved from the gas stream passing to the plasma (3, 4). This is an indication of how the sample introduction pro­ cess can be modified to produce analyte closer to the optimum for the at­ omizer. No published data are avail­ able on limitations of aqueous sample introduction to the ICP, although clearly water loading in the plasma has a direct influence on plasma prop­ erties. In fact, it has been shown for certain ionic lines that doubling the water loading entering the plasma can cause a 100-fold reduction in analyti­ cal signal (5). From a practical standpoint, three important conclusions can be reached. First, it is necessary to introduce sam­ ple to the atomizer with drops no larg­ er than a certain maximum size

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(dmax)- Second, the solvent introduc­ tion rate must fall within a certain permissible band of values. Third, to maintain good system reproducibility, it is essential that all these parameters be controlled carefully over the long term. Any significant change in drop size or solvent loading reaching the at­ omizer could have an adverse effect, both on system accuracy and system reproducibility. From this standpoint, the need to maintain a constant tem­ perature in the plasma box in an ICP system becomes clear, as a means to reduce the baseline drift caused by variable solvent vapor loading (5). Atomic Absorption Systems. Flames are generally far less suscepti­ ble to variations in solvent loading than ICPs are, although the introduc­ tion of organic solvents to an air-acet­ ylene flame can lead to a significant temperature drop. This in turn could cause the onset of interferences due to sample matrix problems. For flame AAS systems, the design of nebulizers and spray chambers appears to have been empirically optimized to provide the best aerosol drop size in the flame for interference-free analyte vaporiza­ tion. Solvent loading appears to be a secondary factor. In the past 20 years AA nebulizers and spray chambers have undergone a steady progression. They have changed from devices producing very coarse aerosols, with a corresponding high incidence of vaporization inter­ ferences, to devices producing much finer aerosols, which are largely free from this type of interference. In fact, recent data indicate that it is possible to virtually eliminate all matrix-in­ duced vaporization interferences in AAS (e.g., calcium-phosphate, siliconaluminum, silicon-manganese, etc.) (6, 7). This is accomplished by shift-

Table I. Limiting Organic Aspiration Rates for ICP a

Solvent

Limiting Aspiration Rate *

Evaporation

(mL/min)

Factor

Methanol 0.1 47.2 Ethanol 2.5 45.6 18.5 Xylenes 1.0 Acetone 0.1 264 MIBK 3.0 77.3 Diethyl ether CO c

g

100 /XL-

50

'co

Έ

50 μ ι

LU

10 uL

0 5

0

10 Time (min)

Figure 10. Flow injection peaks ANALYTICAL CHEMISTRY, VOL. 56, NO. 7, JUNE 1984 · 887 A

i n t r o d u c t i o n . It is therefore possible, with t h e I C P , t o inject s a m p l e s a t t h e r a t e of a p p r o x i m a t e l y 4/min, as op­ posed t o 1.5/min w i t h conventional s a m p l e i n t r o d u c t i o n . Additionally, in A AS, where t h e a d d i t i o n of ionization buffers, l a n t h a n u m releasing agents, etc., m a y be desirable, it is possible to a d d t h e a n a l y t e as a spike i n t o a flow­ ing s t r e a m of t h e desired buffer, m a k ­ ing for a relatively simple e x p e r i m e n ­ tal system (26). Other Techniques for Sample Introduction T h e t e c h n i q u e s considered so far have achieved s u b s t a n t i a l practical use; t h e r e are o t h e r s which h a v e m o r e specialized applications. Laser abla­ tion, in which t h e power from a fo­ cused r u b y laser is used t o vaporize a spot of m a t e r i a l directly from a solid surface, h a s considerable promise (27, 28). A n o t h e r a p p r o a c h of g r e a t inter­ est in metallurgy is t h e use of s p a r k or arc vaporization (29, 30). S o m e inter­ esting studies have b e e n m a d e in which s a m p l e is i n t r o d u c e d i n t o t h e I C P with a carbon rod a n d placed into t h e torch in t h e region of t h e p l a s m a coils b u t below t h e p l a s m a itself (31, 32). Direct inductive h e a t i n g of t h e carbon occurs, a n d t h e s a m p l e v a p o ­ rizes directly into t h e p l a s m a . W i t h t h i s system, very efficient t r a n s p o r t of

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s a m p l e t o t h e p l a s m a is readily accom­ plished. However, vaporization is n o t always very rapid, a n d t h e b r o a d emis­ sion p e a k s t h a t result can s o m e t i m e s lead to poor detection limits. O t h e r devices a i m e d a t obtaining ef­ ficient s a m p l e transfer of solid a n d liquid s a m p l e s t o t h e I C P h a v e been described recently, including a s y s t e m where t h e rf p l a s m a is led i n t o a c h a m ­ ber below t h e t o r c h for s a m p l e vapor­ ization (33). M a n y of t h e devices p r e s e n t l y pro­ posed as a l t e r n a t i v e s t o liquid s a m p l e i n t r o d u c t i o n offer g r e a t promise for specific applications; however, t o achieve w i d e s p r e a d use, t h e y will have t o d e m o n s t r a t e t h e reliability, free­ d o m from interference, a n d t h e ease of use t h a t liquid s a m p l e i n t r o d u c t i o n c u r r e n t l y enjoys. Finally, t h e r e is al­ ways t h e possibility t h a t some t r u l y new s a m p l e i n t r o d u c t i o n t e c h n i q u e , with general applicability, will be de­ veloped. T h e need is certainly t h e r e . Acknowledgment T h i s m a t e r i a l is based on work s u p ­ p o r t e d b y t h e N a t i o n a l Science F o u n ­ dation under Grant No. CHE8019947. References (1) Parsons, M. L.; Forster, Α.; Anderson, D. "An Atlas of Spectral Interferences in

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ICP Spectroscopy"; Plenum: New York, 1980. (2) Boumans, P.W.J.M. "Line Coincidence Tables for Inductively Coupled Plasma Emission Spectrometry"; Pergamon: New York, 1981; Vols. I and II. (3) Boorn, A. W.; Browner, R. F. Anal. Chem. 1982,54,1402. (4) Hausler, D. W.; Taylor, L. T. Anal. Chem. 1981, 53, 1223. (5) Kull, R., Jr.; Browner, R. F. Spectrochim. Acta Β 1983,38, 51. (6) Smith, D. D. PhD Thesis, Georgia In­ stitute of Technology, Atlanta, Ga., 1983. (7) Smith, D. D.; Browner, R. F., submit­ ted for publication in Anal. Chem. (8) Stupar, J.; Dawson, J. B. Appl. Opt. 1968, 7,1351. (9) Novak, J. W.; Lillie, D. E.; Boorn, A. W.; Browner, R. F. Anal. Chem. 1980, 52, 579. (10) Anderson, H.; Kaiser, H.; Meddings, B. In "Developments in Atomic Plasma Spectrochemical Analysis"; Barnes, R. M., Ed.; Heyden and Son: London, U.K., 1981, p. 251. (11) Apel, C. T.; Duchane, D. V. Abstracts of Papers, Pittsburgh Conference on An­ alytical Chemistry and Applied Spec­ troscopy, Cleveland, Ohio, 1979. (12) Layman, L. R.; Lichte, F. E. Anal. Chem. 1982,54,638. (13) Olson, K. W.; Haas, W. J., Jr.; Fassel, V. A. Anal. Chem. 1977,49, 632. (14) Boumans, P.W.J.M.; de Boer, F. J. Spectrochim. Acta Β 1975,30, 309. (15) Taylor, C. E.; Floyd, T. L. Appl. Spectrosc. 1981, 35, 408. (16) Berman, S. S.; McLaren, J. W.; Willie, S. N. Anal. Chem. 1980,52, 488. (17) Mermet, J. M.; Trassy, C. In "Devel­ opments in Atomic Plasma Spectro­ chemical Analysis"; Barnes, R. M., Ed.; Heyden and Son: London, U.K., 1981, p. 245. (18) Boumans, P.W.J.M.; de Boer, F. J. Spectrochim. Acta Β 1976, 31, 355. (19) Garbarino, J. R.; Taylor, Η. Ε. Appl. Spectrosc. 1980,34, 584. (20) Suddendorf, R. F.; Boyer, K. W. Anal. Chem. 1978, 50, 1769. (21) Mohamed, Ν.; Brown, R. M., Jr.; Fry, R. C. Appl. Spectrosc. 1981,35,153. (22) Kirkbright, G. F.; Gunn, A. M.; Mil­ lard, D. L. Analyst (London) 1978,103, 1066. (23) Barnes, R. M.; Fodor, P. Spectrochim. Acta Β 1983, 38,1191. (24) Godden, R. G.; Thomerson, D. R. An­ alyst (London) 1980,105,1137. (25) Greenfield, S. Spectrochim. Acta Β 1983, 38, 93. (26) Tyson, J.; Idris, A. B. Analyst (Lon­ don) 1981,106, 1125. (27) Carr, J. W.; Horlick, G. Spectrochim. Acta Β 1982, 37,1. (28) Thompson, M.; Goulter, J. E.; Sieper, F. Analyst (London) 1981,106, 32. (29) Human, H.G.C.; Scott, R. H.; Oakes, A. R.; West, C. D. Analyst (London) 1976,102,265. (30) Marks, J. Y.; Fornwalt, D. E.; Yungk, R. E. Spectrochim. Acta Β 1983,38,107. (31) Salin, E. D.; Horlick, G. Anal. Chem. 1979,51,2284. (32) Kirkbright, G. F.; Walton, S. J. Ana­ lyst (London) 1982,107, 241. (33) Farnsworth, P. B.; Hieftje, G. M. Anal. Chem. 1984,55,1414. (34) Long, S. E.; Snook, R. D.; Browner, R. F., submitted for publication in Spec­ trochim. Acta B. (35) Fassel, V. Α.; Kniseley, R. N. Anal. Chem. 1974,45,1110 A. (36) Knoller, B. N.; Bloom, H.; Arnold, A. P. Prog. Anal. At. Spectrosc. 1981,4, 81. (37) Nakahara, T. Prog. Anal. At. Spec­ trosc. 1983, 6,163.