EDITORIAL
Secondary Ion Mass Spectrometry—SIMS VII One of the most well-established and yet rapidly developing areas of surface analysis is secondary ion mass spectrometry (SIMS), which provides qualitative and quantitative information about the chemical composition of inorganic and organic materials. The broad scope and powerful capabilities of this technique were highlighted at the Seventh International Conference on Secondary Ion Mass Spectrometry (SIMS VII), held, last September in Monterey, CA. The chairman of the local organizing committee was Charles A. Evans, Jr., of Charles Evans and Associates. Howard A. Storms of General Electric Co., Vallecitos, served as chairman of the program committee. More than 400 scientists from around the world attended and learned about the latest advances in this important surface analytical technique. Twelve years ago, at SIMS I, the significant instrumentation and methodologies were still in their infancy, but many basic themes and goals expressed at that conference remain valid today. These include improved understanding of the physical processes involved in the technique, improved quantitation, increased use of computer-aided analysis, improved instrument performance, and application of the technique to solve problems in new and exciting areas. The most recent conference dedicated a full day to the area of Fundamentals and included a session honoring the late Don E. Harrison of the Naval Postgraduate School. Other areas that remain vital parts of the SIMS discipline include the analysis of semiconductors, instrumentation development, and the application of the technique to geology and metallurgy. The use of the technique for organic and biological analysis was in most cases an untapped resource at the first SIMS
meeting; today, some of the most intriguing and significant advances are in these two areas. Static SIMS, which can provide molecular information about polymer and biological surfaces, is a rapidly advancing technique. The analysis of biologically important systems with SIMS garnered a great deal of attention at the latest meeting. The quantitative imaging of diffusible elements in cells and the high-resolution imaging of 14 C-labeled chromosomes were just some of the highlights. The entire area of imaging was also covered in detail, illustrating the increasing significance of spatially resolved analysis. The format of the SIMS meeting was also significant. Researchers from universities, national laboratories, and leading industrial labs met with the common interest of improving their field. This broad base of interest is important in ensuring scientific integrity and general applicability. Both oral and poster presentations were made, the latter allowing for significant exchange and discussion of ideas. In addition, contributions from student participants are particularly noteworthy, for the youngest members of any field represent that field's future. The nature and progress of the SIMS field mirrors the entire area of analytical chemistry. Analytical techniques must remain based on sound science, yet prove themselves in practical applications. As techniques emerge, the sophistication and complexity of the methods will increase, but so will the quality of the results—providing solutions to problems previously considered impossible to solve.
ANALYTICAL CHEMISTRY, VOL. 61, NO. 23, DECEMBER 1, 1989 • 1311 A
