yJCS-930 'JDual-Wavelength Μ ΤLC Scanner
Ο J CS-920 V ^ High-Speed A / TLC Scanner The first instrument to make direct quantitation of TLC spots available, Shimadzu's CS-920 High-Speed TLC Scanner has a built-in integrator.printer and other techni cal refinements to ensure ex cellent quantitative analysis. Many valuable features: • The automatic lane chang ing mechanism permits ra pid analysis of a large num ber of samples. Up to seven samples a minute can be scanned. • The built-in micro processor provides automatic detection of chromatogram spots. Fused spots are separated and determined automatically. • Unique high-speed zigzag scanning, working curve lin earization, background cor rection, and reflection ab sorption ensure concentra tion-linear output. Thus ex cellent quantitativeness is provided. • Quantitative calculation with either the external or inter nal standard method. • Direct printout of concentra tion values. CIRCLE 190
Shimadzu. Two short cuts to expedient Quantitative TLC Both are data-processor equipped
Shimadzu delivers densitometers equipped for new dimen sions in quantitative TLC. Write today for more information on these and other Shimadzu instruments.
SHIMADZU SCIENTIFIC INSTRUMENTS, INC. SHIMADZU SCIENTIFIC INSTRUMENTS, INC. 7102 Riverwood Drive, Columbia, Maryland 21046, U.S.A. Phone: (301 ) 997-1227 SHIMADZU (EUROPA) GMBH Acker Strasse 111, 4000 Dusseldorf. F.R. Germany. Phone: (0211) 666371 Telex : 08586839 SHIMADZU CORPORATION INTERNATIONAL MARKETING DIV. Shinjuku-Mitsui Building, 1-1, Nishishinjuku 2-chome, Shinjuku-ku, Tokyo 160, Japan. Phone:Tokyo 03-346-5641 Telex:0232-3291 SHMDT J.
The Shimadzu CS-930 DualWavelength TLC Scanner is a refined microcomputerized version of the Shimadzu CS910 Dual-Wavelength Scannera winner of the 1977 l-R Com petition. The CS-930 with par allel line printer is a low cost complete microprocessor con trolled system for quantitative, highly sensitive, high-speed densitometry. The features are outstanding: • Dual-wavelength method eliminates beseline drifts caused by local irregulariti es of layer thickness. • Zigzag scanning method with a very small light beam eliminates errors caused by irregular shape of develop ed spots. • Working curve linearization according to the KubelkaMunk's equations. Built-in microprocessor pro vides: • Signal averaging-smoothing permits the quantitation of nanogram quantity level. • Automatic lane changing up to 30 lanes of chromato gram spots. • Automatic detection of chro matogram spots. • Quantitative calculation with the external or internal stand ard method. The concentra tion values are directly print ed out. • Storage of operational para meters. CIRCLE 189
