SPAN IV Low Cost Computer-Aided P l a s m a S p e c t r o m e t e r s for Trace Element M e a s u r e m e n t s
SMI is recognized and respected as a leader in atomic analysis and today counts more plasma emission spectrometers in use in labo ratories and industries worldwide than any other manufacturer. Plasma spectrometry is widely accepted because it combines the best features of atomic absorption and atomic emission techniques. SPECTRASPANIV — SMI's newest and lowest-cost plasma spec trometer, is a compact, integrated system that performs analyses of elements at trace to major levels including the so-called difficult elements with a minimum of sample preparation. Sequential quantitative analyses of single elements or comprehensive qual itative analysis are available with Spectraspan IV. Conversion between modes of operation can be achieved in seconds. Among the outstanding features of SPECTRASPAN IV are a unique Echelle grating that provides high dispersion of all wavelengths from 1900 to 8000 A° in a 4 χ 5 in. area and a built-in microprocessor for ease of operation and increased system effi ciency.
and P. H. Weiner, ibid., 128, 65 (1976). (26) C. Horvath, W. Melander, and I. Molnar, ibid., 125,129 (1976). (27) C. Horvath, W. Melander, and I. Molnar, Anal. Chem., 49, 142 (1977). (28) H. D. Durst, M. Milano, E. J. Kikta, Jr., S. A. Connelly, and E. Grushka, ibid. 47,1797 (1975). (29) C. R. Hastings, W. A. Aue, and F. N. Larsen, J. Chromatogr., 60, 329 (1971). (30) J. J. Kirkland, Chromatographia, 8, 661 (1975). (31) C. L. Zimmerman, E. Appella, and J. J. Piseno, Anal. Biochem., 77, 569 (1977). (32) J. J. Kirkland, J. Chromatogr. Sci., 9,206(1971). (33) J. H. Knox and G. Vasvari, ibid., 12, 449 (1974). (34) R. H. Hartwick and P. R. Brown, J. Chromatogr., 112,651(1975). (35) R. Schwarzenbach, ibid., 117,206 (1976). (36) F. M. Rabel, Anal. Chem., 45,957 (1973). (37) E. Grushka and R.P.W. Scott, ibid., ρ 1626. (38) Ε. J. Kikta, Jr., and E. Grushka, J. Chromatogr., 135,367(1977). (39) E. Grushka and G.W.K. Fong, u n p u b lished results, SUNY at Buffalo, N.Y., 1977. (40) G. Dotsevi, Y. Sogah, and D. J. Cram, J. Am. Chem. Soc, 98, 3038 (1976). (41) F. Mikes, G. Boshart, and E. Gil-Av, J. Chromatogr., 122, 205 (1976). (42) A. H. Al-Taiar, J.R.L. Smith, and D. J. Waddington, Anal. Chem., 46,1135 (1974). (43) J. J. DeStefano and J. J. Kirkland, J. Chromatogr. Sci., 12, 337 (1974). (44) D. C. Locke, ibid., 11,120(1973). (45) A. Pryde, ibid., 12, 486 (1974). (46) V. Rehak and E. Smolkova, Chroma tographia, 9,219(1976). (47) I. Sebestian and I. Halasz, "Advances in Chromatography", Vol 14, J. C. Giddings, E. Grushka, J. Cazes, and P. R. Brown, Eds., ρ 75, Marcel Dekker, New York, N.Y., 1976. (48) "Bonded Stationary Phases in Chro matography", E. Grushka, Ed., Ann Arbor Science, Ann Arbor, Mich., 1974.
SPECTRASPAN IV is an up-to-date analytical system that offers substantial capability at a modest price. For multichannel analysis capability ask for information on Spectraspan III.
E l i G r u s h k a ( r i g h t ) is a n a s s o c i a t e p r o f e s s o r of c h e m i s t r y a t S U N Y , Buf falo. H i s r e s e a r c h i n t e r e s t s a r e in t h e a r e a s of c h r o m a t o g r a p h i c t h e o r i e s , e n h a n c e m e n t of c h r o m a t o g r a p h i c r e s o l u t i o n , a n d d e s i g n i n g b o n d e d p h a s e s for selective separations. A low cost integrated system for sequential analysis
SPECTRAMETRICS INCORPORATED 204 ANDOVER STREET, ANDOVER, MA 0 1 8 1 0 (617)475-7015 CIRCLE 195 ON READER SERVICE CARD
1014 A · ANALYTICAL CHEMISTRY, VOL. 49, NO. 12, OCTOBER 1977
E d w a r d J . K i k t a , J r . (left), is a r e s e a r c h c h e m i s t for t h e F M C C o r p . , A g r i c u l t u r a l C h e m i c a l G r o u p in M i d dleport, N.Y., where he supervises t h e a n a l y t i c a l c h e m i s t r y s e c t i o n of t h e for mulations group. His current research centers around analytical methods de v e l o p m e n t for n e w p e s t i c i d e p r o d u c t s .
