Langmuir 2000, 16, 2281-2284
2281
Thickness of Spin-Cast Polymer Thin Films Determined by Angle-Resolved XPS and AFM Tip-Scratch Methods C. Ton-That, A. G. Shard, and R. H. Bradley* Materials Surfaces and Interfaces Group, School of Applied Sciences, The Robert Gordon University, St. Andrew Street, Aberdeen AB25 1HG, U.K. Received May 18, 1999. In Final Form: November 5, 1999 Polystyrene (PS) and poly(methyl methacrylate) (PMMA) thin films (
