WaveMetrics, Inc. - Analytical Chemistry (ACS Publications)

WaveMetrics, Inc. Anal. Chem. , 1995, 67 (3), pp 131A–131A. DOI: 10.1021/ ... Altmetric Logo Icon More Article Metrics. ACS Axial: Your Bond With Ch...
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(244) Achieving Custom Manipulation of Sample Data Using Dynamic Data Exchange in Atomic Spectroscopy. F. Délies, Ε. Vanclay

Instrumentation II—Advances in FT-IR, Raman, Sensors, and Optical Methods Room 84 G. J. Meisner, Presiding 1:30 1:50

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(245) Sensitivity Issues in Step-Scan FT-IR Spectrometry. C. Manning (246) Synchrotron Radiation-Powered IR Microspectroscopy Used To Chemically Map Tissue Sections Operating in Trans­ mission Mode. D. L. Wetzel, A. J. Eilert, J. A. Reffner, L. Carr, S. M. LeVine, S. S. Miller, L. Pietrzak (247) Comparative Study of Fiber-Optic Remote Raman Probe Designs. T. F. Cooney, Η. Τ. Skinner, S. M. Angel (248) Tunable External-Cavity Diode La­ sers for Raman Spectroscopy. T. F. Cooney, S. M. Angel (249) Designing a UV-vis System To Meet the Qualification Requirements of the Regulatory Environment. J. P. Ham­ mond, M. Long, P. Davies, M. Brown (250) Integrated Optical Analytical Sensor Based on Antiresonance Waveguides. T. Delonge, H. Fouckhardt (251) Radionuclide Scintillator Light Source for Time-Resolved Fluorometry. D. L. Burden, S. E. Hobbs, G. M. Hieftje (252) Multidimensional Hadamard Trans­ form Spectrometry. M. K. Bellamy, A. N. Mortensen, E. A. Orr, D. A. Mc­ Carthy, J. V. Paukstelis, R. M. Hammaker, W. G. Fateley (253) Multiple-Wavelength Laser Light Scattering for Polymer Analysis. C. E. Mooney (254) Tests for the Survivability of a Thin Film Microelectronic Gas Sensor Struc­ ture for Automotive Applications. S. V. Patel, J. W. Schwank, D. A. Schweiss, J. L Gland, K. D. Wise

Tuesday Morning Symposium: Direct Solids Elemental Analysis—What Technique Do You Use? (Arranged by R. K. Marcus) Room 80 R. K. Marcus, Presiding 8:30 8:35

Introductory Remarks. R. K. Marcus (360) Direct Spark Spectrometries and Spark Ablation ICP Spectrometries. J.A.C. Broekaert 9:10 (361) Present and Future Trends in the XRF Analysis of Solid Materials. P. Pella 9:45 (362) Direct Analysis of Solids by Second­ ary Ion MS. C. W. Magee 10:35 (363) Glow Discharge Devices for Bulk and Depth-Resolved Analyses. R. K. Marcus 11:10 (364) Laser Ablation into ICP-AES and MS: Bulk and Small Feature Analysis. A. Raith

Symposium: Near-Field Imaging and Spectroscopy—The Chemical Perspective (Arranged by P. J. Treado) Room 82 P. J. Treado, Presiding 8:30 8:35

Introductory Remarks. P. J. Treado (365) When Lenses Fail. A. Lewis

(366) Near-Field Fluorescence Micros­ copy and Spectroscopy of Single Mole­ cules. S. Xie, R. Dunn (367) Combined Imaging/Sensing Using 9:45 Polymer-Modified Imaging Fibers. D. R. Walt 10:35 (368) Spectroscopy of Single-NanometerDimension Objects: From Molecules to Quantum Electronic Devices. T. D. Har­ ris, J. K. Trautman, J. Macklin, R. D. Grober, H. Hess 11:10 (369) Progress on Applications in NearField Scanning Optical Microscopy. P. Moyer 9:10

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Applications in Raman Spectroscopy

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Room 83 C. McCreary, Presiding

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(380) Design, Performance, and Applica­ tions of a Compact Raman Spectrome­ ter. H.F.J. Cormican, M. G. Catney, J. J. McGarvey 8:50 (381 ) Characterization of Paint Films by Raman Spectroscopy. C. K. Mann, B. Sun, T. J. Vickers 9:10 (382) Process Control in Petroleum Indus­ try by Raman Spectroscopy. N. Zanier, P. Marteau, F. Cansell, A. Aoufi, G. Hotier, D. Silva 9:30 (383) Nondestructive Evaluation of Me­ chanical Properties in Fiber-Reinforced Composites by FT-Raman Spectroscopy. S. Farquharson, R. Basilakis, M. Carangelo, M. DiTaranto, W. Smith, M. A. Serio, P. R. Solomon, C. Petty, R. Elleithy, T. Ebeling, J. F. Wallace 9:50 (384) In situ Analysis of TLC Frac­ tions—A New, Simple Method for Sur­ face-Enhanced Raman Spectroscopy. J. J. Andrew, B. P. Newby, C. J. Adams 10:25 (385) UV Resonance Raman Microscopy. V. Pajcini, R. W. Bormett, S. A. Asher 10:45 (386) UV-Raman Spectroscopy Monitors the First-, Second-, and Third-Order Phonon Bands of Diamond and the C - H Stretching Bands of Nondiamond Compo­ nents of CVD Diamond Films. R. W. Bormett, S. A. Asher, R. E. Witkowski, W. D. Partlow 11:05 (387) Ultrasensitive Detection of Pyrene by UV Resonance Raman Spectrometer Using an Intracavity Frequency-Doubled CW Argon Ion Laser. Z. Chi, S. A. Asher

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FT-IR—Process and Interfacial Applications Room 87 J. A. de Haseth, Presiding 8:30

(408) FT-IR Process Monitoring for Opti­ mization of ΝΟΛ Control at Coal-Fired Power Plants. A. S. Bonanno, C. M. Nel­ son, K. S. Knight, M. A. Serio, P. R. So­ lomon 8:50 (409) Real-Time Monitoring of Metal Pow­ der Size and Temperature by FT-IR Spectroscopy for Intelligent Process Con­ trol. S. Farquharson, P. Rosenthal, J. Cosgrove, J. Haigis, J. R. Markham, P. R. Solomon, S. Ridder, F. Biancaniello 9:10 (410) A Novel Approach to Open-Path FT-IR Spectroscopy. R. L. Richardson, P. R. Griffiths 9:30 (411) Diels-Alder Reaction Analyses Us­ ing a Mid-IR Fiber-Optic Probe. J . A. Van Gompel 9:50 (412) Anomalous Bandshapes in SurfaceEnhanced IR Absorption Spectroscopy on Metal Films. G. T. Merklin, P. R. Grif­ fiths 10:25 (413) Micro-Raman Imaging of an Epoxy at an Interfacial Region. C. M. Stellman, M. L. Myrick

IGOR For Macintosh and Power Mac Free demo available via anonymous ftp at: d31 rzO.stanford.edu /IgorPro/Oemo/* WaveMetrics, Inc. P.O.Box 2088 Lake Oswego, OR 97035 Tel: (503) 620-3001 Fax: (503) 620-6754 Internet: [email protected] CIRCLE 11 ON READER SERVICE CARD

Analytical Chemistry,

Vol. 67, No. 3, February 1, 1995 1 3 1 A