News las, Texas. Sponsor: ASTM Com mittee E-14. CONTACT: J. M. McCrea, Applied Research Laboratory (73), U. S. Steel Corp., Monroeville, Pa. 15146. Page 47 A, Dec. May 20 to 21—Fourth Annual Seminar on Pesticide Residue Analysis. Uni versity of Manitoba, Winnipeg, Mani toba, Canada. Sponsors: Canada Dept. of National Health and Welfare and Manitoba Dept. of Health. CON TACT: Ben Berck, Canada Dept. of Agriculture Research Station, Winni peg, Canada May 21 to 23—10th Symposium on Electron, Ion, and Laser Beam Tech nology. NBS, Gaithersburg, Md. CONTACT: L. Marton, National Bu reau of Standards, Washington, D.C. 20234 May 25 to 28—52nd Canadian Chemi cal Conference and Exhibition. Queen Elizabeth Hotel, Montreal, Que. CON TACT: Chemical Institute of Canada, 151 Slater St., Ottawa 4, Ontario, Canada May 26 to 30—XV Colloquium Spectroscopicum Internationale. Madrid, Spain. CONTACT: E. Arsensi Alva rez-Arenas, Serrano, 119, Madrid-6, Espana June 4 to 6—International Congress on Automated Analysis. Conrad Hilton Hotel, Chicago, III. CONTACT: Je rome E. Golin, Technicon Corp., Ardsley, Ν. Υ. 10502 June 5 to 6—Third Great Lakes Re gional ACS Meeting. DeKalb, III. Includes Analytical Chemistry Ses sions, CONTACT: Richard C. Bow ers, Northern Illinois University, De Kalb, III. 60115 June 5 to 11—Fifth International Meet ing of Forensic Sciences. Toronto, Canada. CONTACT: Frank L. Wilson, Dept. of the Attorney General, Parlia ment Bldg., Toronto 2, Canada June 9 to 13—Gordon Research Con ference on Magnetic Resonance. New Hampton School, New Hampton, N.H. CONTACT: W. George Parks, University of Rhode Island, Kingston, R.I. June 11 to 13—ACS Analytical Chem istry Summer Symposium. University of Georgia, Athens, Ga. Sponsors: Analytical Chemistry Division and ANALYTICAL CHEMISTRY. Subject: Modern Instrumental Techniques for Elemental Analysis. CONTACT: G. H. Morrison, Dept. of Chemistry, Cornell University, Ithaca, Ν. Υ. 14850. Page 45 A, Apr. June 12 to 13—Vacuum Microbalance Techniques, Eighth Conference. Wakefield (near Boston), Mass. CON TACT: W. W. Czanderna, Dept. of Physics, Clarkson College of Tech nology, Potsdam, N.Y. 13676 June 12 to 13—24th Annual Northwest Regional ACS Meeting. University of Utah, Salt Lake City, Utah. Includes Analytical Chemistry Sessions. CON TACT: Edward M. Eyring, Dept. of Chemistry, University of Utah, Salt Lake City, Utah 84112 June 22 to 27—ASTM 72nd Annual Meeting. Chalfonte-Haddon Hall, At lantic City, N. J. CONTACT: Ameri can Society for Testing and Mate rials, 1916 Race St., Philadelphia, Pa. 19103 June 23 to 25—4th IMEKO—Photon Detectors Symposium. Hotel Inter national, Prag. CONTACT: IMEKO Secretariat, Budapest, 5, P. Ο. Β. 457
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A compact, high-performance unit with a versatile optical system that provides both internal reflection and transmission capability. The Model 8 can be sup plied as a complete instrument, or as a field modification. Other custom mod ifications available.
Model 12 Double-Beam Attachment Quality and analytical versatility are of fered in the Model 12. Dual-optical system has self-contained beam attenuator, and the reference and sample beam assem blies are track-mounted for rigidity and ad justment for different beam separations. Differential analysis is possible. Fits most IR spectrophotometers. Model 50 Variable-Angle Internal Reflection Attachment This is the A.T.R. attachment for "the an alyst who has everything". It has the most advanced design of any A.T.R. infrared at tachment available. Continuously variable adjustment from 30° to 60°. Particularly useful in studying changes and effects of surface treatments on films, elastomers, and other materials. Model 9 Single-Beam Attachment Of such high-performance, the Model 9 has frequently been copied — but never equalled. You have the versatility of 30°, 45°, and 60° angles of incidence. Reflector plates in all materials may be utilized. Fits all Perkin-Elmer and Beckman Spectro photometer sampling compartments.
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VOL. 4 1 , NO. 4, APRIL 1969
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