ANALYTICAL CHEMISTRY
NEWS
15th Annual M i d - A m e r i c a Symposium on Spectroscopy rpifiE
15TH ANNUAL
MID-AMERICA SYMPOSIUM
ON
SPEC-
*- TROSCOPY will be held in Chicago, J u n e 2 through 5, a t t h e Sheraton-Chicago Hotel. This symposium is sponsored b y t h e Chicago Section of t h e Society for Applied Spectroscopy in cooperation with t h e St. Louis, N i a g a r a Frontier, Detroit, Cleveland, Indianapolis, a n d Milwaukee Sections of t h e So ciety a n d t h e Chicago G a s C h r o m a t o g r a p h y Discussion Group. M o r e t h a n 100 c o n t r i b u t e d a n d invited technical p a p e r s are scheduled t o be presented in 23 separate technical ses sions. T h e detailed p r o g r a m is given below. I n addition to the technical presentations, about 35 m a n u f a c t u r e r s a n d suppliers of s p e c t r o g r a p h s a n d gas chromatographic equip ment will exhibit latest developments in these fields. Regis t r a t i o n is open to all interested persons; t h e fee will be $ 8 ; students, $ 1 . R o o m reservations should b e addressed t o Reservation Office, Sheraton-Chicago Hotel, 505 N o r t h Michigan Ave., Chicag:o, 111. 60611, a n d should be sent before M a y 20. A new award, to be presented annually will be announced. This is to be known as t h e Chicago Section Spectroscopy A w a r d and is offered to encourage t h e a d v a n c e m e n t a n d s t u d y of spectroscopy in Chicago area schools. A stipend of $500 will be presented t o a full-time g r a d u a t e student in t h e area. T h i s award will take place before a joint session of t h e symposium on Wednesday, J u n e 3, a t 1:30 P . M . F u r t h e r information on this symposium is available from Elwin N . Davis, C h a i r m a n , 15th M i d - A n n u a l Symposium on Spectroscopy, Sinclair Research, Inc., 400 E . Sibley Blvd., H a r v e y , 111. 60426.
9:10 Construction and Performance of Highly Efficient Micro Gas Cells for the Infrared. K. E. Stine, D . Mc Carthy, H . J. Sloane, Beckman Instruments, Inc., Fullerton, Calif. 9:35 Electronic Phase Null Photometric System of the ICI 2000 Infrared Spectrophotometer. C. W. Warren, A. W. Chappie, Instruments and Communications, Inc., Wilton, Conn. 10:20 T h e Identification of Fibers and Fabrics by Internal Reflection Spectroscopy. P . A. Wilks, Jr., M. R. Iszard, Wilks Scientific Corp., Norwalk, Conn. 10:35 Multicomponent Infrared Analysis by the Absorbance Ratio Method. A. S. Wexler, Dewey and Almy Chemical Division, W. R. Grace & Co., Cambridge, Mass. 11:05 Infrared Spectra of Iodinated Polystyrene. J. P . Luongo, R. Salovey, Bell Telephone Laboratories, Murray Hill, N . J. ULTRAVIOLET—VISIBLE SPECTROSCOPY Tuesday Morning—East Room Bruno Jaselslcis, Loyola University, Chicago, I I I . , Presiding
9:00 A New Molybdenum Blue Method for the Determina tion of Silicon in Steel. Uno T. Hill, Inland Steel Co., East Chicago, Ind. 9:30 Theory and Applications of Diffuse Reflectance Spec troscopy. Audrey L. Companion, Illinois Institute of Tech nology, Chicago, 111. 10:00 Optical Absorption of CO*3 in Perovskite Oxides. Charles S. Naiman, Arthur Linz, Mithras, Inc., Cambridge, Mass. 11:00 Adaptation of an Inexpensive Ultraviolet-Visible Spectrophotometer for Enzyme Kinetic Work. David L. Heyse, University of Chicago, Chicago, 111. 11:30 Spectra of Halegeno Complexes of Nickel(II) in Molten Media at Elevated Temperatures. G. P . Smith, Oak Ridge National Laboratory, Oak Ridge, Tenn.
PROGRAM
X-RAY SPECTROSCOPY
TUESDAY. JUNE 2
Tuesday Afternoon—Tally-Ho Room
X-RAY SPECTROSCOPY Tuesday Morning—Tally-Ho Room Joan E. Westermeyer, National Lead Co., Titanium Division, St. Louis, Mo., Presiding
9:00 Soft and Very Soft Fluorescence Analysis: Spectro graphic and Electronic Modifications for Optimum, Auto mated Results. A. K. Baird, D . B. Mclntyre, Ε. Ε. Wcldoy, Department of Geology, Pomona College, Claremont, Calif. 9:25 Soft X-Ray Emission Spectra of Metals and Alloys. Paul F . Kellen, Brian J. Thompson, Technical Operations Research, Burlington, Mass. 9:50 P r i m a r y and Secondary Excitation of Low Energy X-Ray Spectra. John W. Thatcher, William J. Campbell, TJ. S. Dept. of the Interior, Bureau of Mines, College Park, Md. 10:45 Demountable X-Ray Tube for Light Element Fluo rescence Analysis. James A. Dunne, William R. Muller, Philips Electronic Instruments, Mount Vernon, Ν. Υ. 11:10 Relationship Between X-Ray Tube Target Materials and X-Ray Emission Intensities. Frank Bernstein, General Electric X - R a y Corp., Milwaukee, Wis. 11:35 Detection and Measurement of X-Rays with Electronic Detectors. Victor E. Buhrke, Picker X-Ray Corp., San Francisco, Calif. INFRARED—RAMAN Tuesday Morning—San Juan Room James McGinness, Sherwim Williams Co., Chicago, III., Presiding
W i l l i a m T. C a v e , Monsanto Chemical C o . , St. Louis, M o . , Presiding
2:00 T h e Determination of Trace Elements by X-Ray Spectrochemical Analysis. T. C. Loomis, Bell Telephone Laboratories, Murray Hill, N . J. 2:25 Applications of Chemical Precipitation Methods for Improving Sensitivity in X-Ray Fluorescent Analysis. J. S. Rudolph, Owen H . Kriege, Robert J. Nadalin, Westinghouse Research Laboratories, Pittsburgh, Pa. 2:50—Use of X-Ray Emission Spectroscopy in the Chemical Analysis of Lake Sediments Containing Forty Elements. Ursula M. Cowgill, Yale University, Department of Biology, New Haven, Conn. 3:45 Determination of Niobium and Tantalum in High Alloy and Stainless Steel. Roger W. Taylor, A. O. Smith, Milwaukee, Wis. 4:10 T h e Influence of Origin of R a w Materials on the X-Ray Analysis of Cements. H. T . Dryer, H . Renton, Ap plied Research Laboratories, Detroit, Mich. 4:35 T h e Analysis of Uranium and Thorium in U r a n i u m Thorium Carbide Mixtures by X-Ray Fluorescence. Vernon J. Rolland, Union Carbide Corp., Carbon Products Division, Fostoria, Ohio. INFRARED—RAMAN
Tuesday Afternoon—San Juan Room Forrest F. C l e v e l a n d , Illinois Institute of Technology, Chicago, I I I . , Presiding
2:00
Selection Rules for Solids.
J. Ziomek, P . Picker
M o r t i n
