NEWS
Bernhard Wunderlich Honored B e r n h a r d Wunderlich, professor of chemistry at Rensselaer Polytechnic Institute, received the 1971 Mettler Award in T h e r m a l Analysis a t the Third Annual Conference of the I n t e r national Confederation for T h e r m a l Analysis, Davos, Switzerland, August 1971. T h e Award consists of a cita tion a n d $1000 donated b y Mettler I n strument Corp. of Princeton, N . J . D r . Wunderlich is honored for his inter pretation and evaluation of factors t h a t influence heat transfer t h a t have extended the quantitative utilization of thermal methods of analysis. H e has emphasized exploring t h e limits of dif ferential thermal analysis, and by so doing has broadened its application. D r . Wunderlich is in charge of the ACS Short Course on Solid State of Polymers and is a member of t h e E d i torial Advisory Boards of Die Makromolekulare Chernie and the Journal of Polymer Science, Part A2. H e is also a member of ACS, AAAS, Sigma X i , a n d t h e International Confederation for T h e r m a l Analysis.
Scanning Electron Microscopy A workshop on biological specimen preparation for scanning electron microscopy will be sponsored by I I T Research institute, April 27, 1971. T h e workshop will follow t h e Fifth Annual Scanning Electron Microscope Sym posium being held April 25 and 26 in Chicago, 111. For the workshop, papers encompassing techniques, re sults, and experience in specimen preparation are invited. Papers are also invited for the symposium. Ab stracts, 200 to 400 words long, are re quested before December 1, • 1971. Manuscripts are due F e b r u a r y 15, 1972. All inquiries should be sent to D r . Om Johari, Director, Annual S E M Symposium, I I T Research Institute, 10 West 35th St., Chicago, 111. 60616. 312-225-9630
Measurement Seminars Seminars and workshops on two topics have been announced b y N B S . Radiation Quantities will be considered at the N B S Laboratories in Gaithersburg, Md., M a y 9 to 12, 1972, a n d
Energy Measurements, write to : Ad ministrative Officer, N B S Q u a n t u m Electronics Div., Boulder Col. 80302. 313-447-3671
Crystallography
Bernhard Wunderlich
Laser Power and Energy Measure ments will be covered at NBS's Boulder, Col., facilities, M a r c h 9 to 10. P a r ticipation is open to a limited number of persons from measurement and stan dards laboratories. Those interested in attending should send a letter of application including applicant's name and address, citizenship, company af filiation, title of position, college level training, and supervisory or lab ex perience related to measurement. T h e course of Radiation Quantities will cover measurement of four cate gories of radiation: X-ray, electrons, neutrons, and radioactivity. The seminar of Laser Power and Energy Measurements will discuss the prin ciples and techniques used by N B S to measure the power and energy out p u t of lasers. Topics discussed will in clude calorimeters, detectors of vari ous types, beam sampling methods, pulse shape measurements, and error analysis. For more information on the Radia tion Quantities seminar, write to Ε . Η . Eisenhower, N B S Center for Radiation Research, Washington, D.C. 20234. F o r the seminar of Laser Power and
T h e Crystallography Group of T h e Institute of Physics is organizing a con ference on Phase Analysis: Identi fication and Quantitative Determina tion, at the University of Hull, April 5 to 7, 1972. T h e meeting will cover recent developments and applications of X - r a y powder diffraction in the field of phase analysis; invited papers will introduce the main topics. Ses sions will deal with improved methods of obtaining and handling data, includ ing indexing, with applications to both inorganic and organic materials, and with comparisons between X-ray and other methods such as electro probe microanalysis and dta. Contributions of u p to 15 min are invited. Interested persons should send 300-word sum maries to D r . W. J. Duffin, D e p a r t m e n t of Physics, T h e University, Hull H U 6 7 R X , England, before J a n u a r y 22, 1972. Other details and attendance application forms are available by writ ing to t h e Meetings Officer, T h e Insti tute of Physics, 47 Belgrave Square, London SW1X 8QX, England.
Opportunity in Australia T h e D e p a r t m e n t of Analytical Chem istry in the School of Chemistry a t the University of New South Wales, Sydney, Australia, (the only analyti cal chemistry department in the 15 Australian universities) has a vacancy for a visiting lecturer on study leave for six to 12 months to participate in instruction for a new master's degree ( M C h e m ) formal study course in mod ern analytical chemistry. T h e visit ing lecturer m a y also participate in existing research topics in the depart ment or work on his own project. T h e large chemistry facilities have a staff of over 150; total university enroll ment is 15,000. F u r t h e r details m a y be obtained b y writing to Prof. L. E . Smythe, Head, D e p a r t m e n t of Analyti cal Chemistry, University of New South Wales, Kensington, 2033, N.S.W., Australia.
ANALYTICAL CHEMISTRY, VOL. 4 3 , NO. 13, NOVEMBER 1 9 7 1
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News
Accuracy in Spectrophotometry A Conference on Accuracy in Spectrophotometry and Luminescence Measurements will be held at the National Bureau of Standards, Gaithersburg, Md., March 22 to 24, 1972. Sponsored by NBS's Analytical Chemistry Division, the conference will feature 18 internationally known speakers and panelists with broad experience in their fields. Problems in both physics and chemistry related to accuracy in spectrophotometry and luminescence measurements and a critical survey of analytical needs, with special attention given to measurement problems in the health and environment, will be defined and discussed at the conference. The topics will include discussions of the basic principles, instrumental parameters, criteria for standards, and specific needs. More information is available from Oscar Menis, General Chairman, Chemistry Bldg., National Bureau of Standards, Washington, D.C. 20234
Radiation Detectors
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ANALYTICAL CHEMISTRY, VOL. 43, NO. 13, NOVEMBER 1971
Radiation detectors will be the subject of the 13th Scintillation and Semiconductor Counter Symposium to be held March 1 to 3, 1972, at the Shoreham Hotel, Washington, D.C. Sponsors are the Nuclear Science Group of the Institute of Electrical and Electronics Engineers, the Atomic Energy Commission, and the National Bureau of Standards. Attendees will be concerned with new improvements and new applications for radiation detectors as well as with current problems. Single sessions of invited and contributed papers will cover the following topics: scintillation and fluorescence phenomena; photomultipliers ; single optical photon detection; semiconductor detectors; track-imaging, spark, and proportional counters; X-ray detection and spectroscopy; other detectors of ionizing radiation; spectrometry; biomedical detectors and applications; detector arrays and data handling; signal conditioning circuits; low-noise preamplifiers; space applications; and scintillation and semiconductor detector applications. Dr. Gordon MacDonald of the President's Council of Environmental Quality -will be the speaker at the banquet planned for March 1. Also associated with the Symposium will be an exhibit of the latest equipment in the field. More information is available from the NBS Office of Technical Information and Publications, Room A500/Admin., Washington, D.C. 20234. 301-921-2691
News
Scheduled Courses in Analytical Techniques Information is given in the following order: date, name of course, location of course, professional person(s) in charge of course, and/or sponsoring organizations, and Contact (numbers in parentheses refer to addresses and telephone numbers given at the bottom of the list of scheduled courses). Nov. 15 to 17—Liquid Chromatography. Chicago area. Varian Aerograph. Contact ( I ) Nov. 15 to 19—Electron Optics. Chicago, III. McCrone Research Institute. Contact (2) Nov. 15 to 19—Two Separate Courses: Infrared Interpretation, Part I; Mass Spectrometry. Philadelphia, Pa. Sadtler Research. Contact (3) Nov. 18—Color Seminar. Pittsburgh, Pa. Hunterlab. Contact (1) Nov. 18 to 20—Liquid Chromatography. Chicago area. Varian Aerograph. Contact (1) Dec. 2 to 4—Evaluation and Interpretation of Physical and Chemical Methods of Analysis. Red Carpet Inn, Charlotte, N.C. John Mandel, Grant Wenimont, American Society for Quality Control. Contact: Mrs. Wylene Wylie, 1051 Ridge Rd., Rock Hill, S.C. 29730 Dec. 5 to 10—Minicomputers and Interfacing. Virginia Polytechnic Institute, Blacksburg, Va. R. E. Dessy, D. G. Larsen. ACS. Contact (4) Dec. 6 to 8—Liquid Chromatography. Washington, D.C. area. Varian Aerograph. Contact (5) Dec. 6 to 10—Two Separate Courses: Gas Chromatography; Nuclear Magnetic Resonance. Philadelphia, Pa. Sadtler Research. Contact (3) Dec. 9 to 11—Liquid Chromatography. Washington, D.C. area. Varian Aerograph. Contact (5) Dec. 10 to 11—Intermediate Gas Chromatography. Berkeley, Calif. H. M. McNair, R. S. Juvet, S. P. Cram. ACS. Contact (4) Dec. 15 to 17—Basic Gas Chromatography. Atlanta, Ga. area. Contact: Tom Campbell, Varian Aerograph, 180 Allen Rd., N.W., Atlanta, Ga. 30328 Jan. 3 to 14—X-ray Spectrometry. State University of New York at Albany. Contact: Henry Chessin, State University of New York at Albany, Dept. of Physics, 1400 Washington Ave., Albany, N.Y. 12203 Jan. 10 to 14—X-ray Diffractometry and Spectroscopy. University of Texas. H. Steinfink. Contact: Engineering Institutes, P.O. Box K, The University of Texas at Austin, Austin, Tex. 78712 Jan. 24 to 28—Measurement Systems Engineering. Arizona State University, Tempe, Ariz. Contact: Peter K. Stein, Engineering Center, Arizona State University, Tempe, Ariz. 85281. 602-965-3124 Jan. 24 to 28—Gas Chromatography. Philadelphia, Pa. Sadtler Research. Contact (3) (1) Ed Klein, Varian Aerograph, 205 W. Touhy Ave., Park Ridge, HI. 60068 (2) Mrs. Miriam Fallert, Registrar, McCrone Research Institute, 451 E. 31st St., Chicago, III. 60616. 312-842-7105 (3) Sadtler Educational Div., Sadtler Research Laboratories, Inc., 3316 Spring Garden St., Philadelphia, Pa. 19104. 215-382-7800 (4) Education Dept., American Chemical Society, 1155 Sixteenth St., N.W., Washington, D.C. 20036. 202-737-3337, ext. 258 C5) Ed Gelb, Varian Aerograph, # 2 5 Route 22, Springfield, N.J. 07081
Auger Spectroscopy A one-day meeting on Applications of Auger spectroscopy is being organized by the Electronics Group of The Institute of Physics in conjunction with the Vacuum and Thin Films and Surfaces Groups, and will be held at Imperial College, February 23, 1972. The meeting will be of an introductory nature, being aimed at present and future users of the technique. Invited papers will be given on techniques of surface analysis by J. Riviere (AERE Harwell) and an introduction to Auger spectroscopy by M. Prutton (University of York). Following these, there will be 15-min contributed papers. More information is available from The Institute of Physics, 47 Belgrave Square, London SW1X 8QX, England.
1st European Analytical Conference The Analytical Chemistry Division of the Gesellschaft Deutscher Chemiker, the Sectie voor Analytische Chemie van de Koninklijke Nederlandse Chemische Vereniging, and the Society for Analytical Chemistry jointly will organize "Euroanalysis 1" to meet August 28 to 31, 1972, in Heidelberg, Germany. Euroanalysis 1, sponsored by the Federation of European Chemical Societies, will be the first meeting of its kind and will be repeated at regular intervals. The subject matter of the conference will cover all aspects of analytical chemistry. Lectures are planned to cover the following: electron spectroscopy and photoionization, high polymer analysis, pollution analysis, separation and preconcentration, elec-
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A new Journal of Physical and Chemical Reference Data will begin publication in 1972 and will include the output of the National Standard Reference Data System, consisting of data compilations and critical reviews covering all major areas of the physical sciences. Publication of the journal will be handled jointly by the American Institute of Physics and the American Chemical Society. Initial plans call for four issues per year plus several longer compilations which will appear as special supplements. The editorial board of the new journal will have representation from XBS, AIP, and the ACS, with the editor appointed by NBS. Printing and distribution will be carried out by AIP. Each society will include the Journal of Physical and Chemical Reference Data in the list of journals of-
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Coming Events Dec. 1 to 3—ACS Southwest Regional Meeting. San Antonio, Tex. Contact: John T. Goodwin, Jr., Southeast Research Institute, 8500 Culebra Rd., San Antonio, Tex. 78228 Dec. 6 to 11—16th Laboratory Exhibition. Porte de Versailles, Paris, France. Contact: J. L. Salles, 16th Exposition du Laboratoire, 10, Avenue Hoche, Paris 8*, France Dec. 26 to 31—American Association for the Advancement of Science. 138th Annual Meeting. Philadelphia, Pa. Contact: D. W. Thornhill, AAAS, 1515 Massachusetts Ave., N.W. Washington, D.Ç. 20005
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29th Annual Pittsburgh Diffraction Conference. Mellon Institute, Pittsburgh, Pa. Contact: Larry Thomas, U.S. Steel Corp., Fundamental Research Laboratory, Monroeville, Pa. 15146. Page 44 A, July
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ACS Southeast Regional Meeting. Nashville, Tenn. Contact: John E. Bishop, E. I. du Pont de Nemours & Co., Inc., Drawer 219, New Johnsonville, Tenn. 37134
NOV. 8 to 1 0
Joint Conference on Sensing of Environmental Pollutants. Cabana Hyatt House, Palo Alto, Calif. Contact: Robert L. Chapman, Beckman Instruments, Inc., 2500 Harbor Blvd., Fullerton, Calif. 92632. Page 68 A, Apr.
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