vided into four parts (text, tables, illustrations, and bibliography), and material relevant to any structure must be sought in each of these parts. This division of material is unfortunat,e, since i t cansiderably complicates the task of aequiring information concerning specific erystal structures. Chapters 11 and 12 contain descriptions of miscellaneous inorganic compounds and of the silicates rcspoctivcly. The inorganic crystals arc elassificd into eomplcx and basic halides, thio salts, complex sulfides, complex oxides, and misrellanoous compounds. The classification followed with the dicates is the conventional one, i.e., into isolated silicate groups, silicate chains and shees, and silicate ncts. Crystal s t n ~ t o r e s presentrd include those dotermined up t o 1955. Thc illustrations are not included with these two chapters although they are present in the supplements to prcvionn chapt,ers. The material described above forms n necessary addition t o tho cxisting volumes of "Cr,vstal Strncturcs." The valumca themselves are of value as referenrp mat,erial, since they rcpwnent thc only comprehensive at,tempt t o r l a d v thr available crystallographio d a t a DAVI11 R. D.AYIES
N*TIOB*L INBTITUTE OF RTALTII Br.n,cn"*, M*nrr.*su
TRACE ANALYSIS Edited by John H. Yoe, Professor of Chemistry, University of Virginia, and Henry L. Koch, Ir., Sloan-Kettering Institute for Cancer Research. John Wiley & Sons, Inc., New York, 1957. xiii 672 pp. 15.5 X 23.5 cm. $12.
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THISbook is a compilation of t,he papem and discussions presented st the S y m p o ~ ium on Trace Analysis held a t the Nen. York Academy of Medicine in the fall of 1955. This symposium was sponsored jaint,ly h y t h e Rockefeller Foundation and t h e Sloan-Kettering Inst,itutc. Tho purpose of the symposium xas "to hring together for comparison and discussion mtharities in tho various scientific disriplines which are related t o the analysis of trace ean~tituentsin industrial, agricultural, biological, srrl medical fields." The text is divided int,o thrcc parts. Part I, Methodology, consists of 20 ehapters; Part 11, Instntmsntntion, 2 chapters; and Part 111, Sensitivity, Sepsration, Concentration, and Cont,aminat,ion, 2 chapters. Each chapter is introduced by a n abstract which is concise antl well u~it,ten. All but a few chapters (papers) have as their conclusion the results of a disc~tssionand question and answer session. I n every case the authors and discussion leaders do a n excellent job of handling each individual topic. References, figures, and tables are adequate. As is usual in books of this kind, there is a lack of continuity between mxessive
chapters. For this reason the rcvicwr r ~ g r c t s that R mow c o m p l ~ t e rubjcet index has not heen given. Rppresmtntive rhapters are as follows: Ion Ezrhange, Spot Tests, Colorimetry, Ampwometr-, Mass Spectroscopy, Instrumerkation, and Separation, Conrmtmtion, and Contsminat,ion. At best rarh paper ~".ewc"t,s x quick survey of a field and its rurlrnt statua. Hcrein liw the valw of thr book in thnt in one valumr t h TPB~CI. ~ ran find 3 brief introduction t o many trrhniqurs whose principles ran he applied to t h e determination of t,rnre a m o u n t of many ronst,ituents. JA.\ICS .\I. P.WI'i?SIl.AGEN I
