MEETINGS conversion factor derived from position measurements of 2 known lines in the spectrum. The ion intensity—both peak and half-width—would be derived from a given plate calibration. With another computer program, a number of routine analyses were described of which the following was typical. Fifteen samples of thoria powder were analyzed for 50 impurities at levels down to 0.1 ppma in 9 man-days. Another computer program which was presented is regularly used in rare earth analysis. The sixth topic, led by J. Roboz (Air Reduction Co.), dealt with thin-film analysis. In addition to scanning methods already in the literature, a novel technique was described using a unidirectional short-pulse sparking system. The positive ion contribution from the cathode probe is negligible. By mounting the film normal to the ion axis the self-shielding is stabilized. Detection limits of about 1 ppma and analytical depths of about 1 micron minimum were achieved. The workshop discussions revealed promising repeatability in the analyses of mass resolved ion samples from mass spectra recorded on ion-sensitive plates in many cases, but there were notable exceptions. The expressed needs for standard reference materials in rare earths, liquid metals like sodium, and biological samples indicate the diverse fields to which the spark source technique is being applied and where problems are encountered. The increasing avalanche of data points toward computer processing but the state of the art strongly suggests that the experimenter still needs to be able to interject his judgment easily during this processing. The last of the four half-day sessions was devoted to clinics by the respective instrument makers for their own clients, general tours of the National Bureau of Standards, and personal visits to individual laboratories. The open unrestrained discussion of common problems and the free exchange of ideas, that characterized this workshop was achieved in part by two conventions—no photographing of projected material from slides would be done; no one would be quoted directly. Hence the anonymity that permeates this account of the workshop. A second workshop of this kind will be held during the ASTM committee E14 conference on Mass Spectrometry and Allied Topics meeting in Pittsburgh, May 12-17, 1968. This will be a half-day session entitled "Workshop on Solids Mass Spectrometry." It will be sponsored and organized by Subcommittee VII, R. E. Honig, Chairman.
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