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diameter to the diameter of the nanocrystals. For example, we could control the number of 50-nm-diameter nanoparticles in a single hole, from one to t...
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NANO LETTERS

Integration of Colloidal Nanocrystals into Lithographically Patterned Devices

2004 Vol. 4, No. 6 1093-1098

Yi Cui,†,‡ Mikael T. Bjo1 rk,‡ J. Alexander Liddle,‡ Carsten So1 nnichsen,‡ Benjamin Boussert,† and A. Paul Alivisatos*,†,‡ Department of Chemistry, UniVersity of California, Berkeley, California 94720, and Materials Sciences DiVision, Lawrence Berkeley National Laboratory, Berkeley, California 94720 Received April 5, 2004

ABSTRACT We report a facile method for reproducibly fabricating large-scale device arrays, suitable for nanoelectronics or nanophotonics, that incorporate a controlled number of sub-50-nm-diameter nanocrystals at lithographically defined precise locations on a chip and within a circuit. The interfacial capillary force present during the evaporation of a nanocrystal suspension forms the basis of the assembly mechnism. Our results demonstrate for the first time that macromolecule size particles down to 2-nm diameter and complex nanostructures such as nanotetrapods can be effectively organized by the capillary interaction. This approach integrates the merits of bottom-up solution-processed nanostructures with top-down lithographically prepared devices and has the potential to be scaled up to wafer size for a large number of functional nanoelectronics and nanophotonics applications.

Colloidal nanostructures such as metal nanocrystals1,2 and semiconductor quantum dots,3,4 nanorods,5 and nanotetrapods6 with precisely controlled sizes in the range of 1 to 100 nm exhibit a range of behaviors distinct from those of nanostructures fabricated by vacuum deposition or lithography and are promising building units for nanotechnology. This promise will not be fulfilled, however, unless methods of positioning and addressing these units individually can be developed. Advances in lithography have enabled the precise and reproducible patterning of features from tens of nanometers to the macroscopic scale.7,8 A synergetic combination of colloidal nanostructures with lithographic patterning can enable the precise control necessary to produce highly integrated nanostructure assemblies on all length scales.9 Previous efforts in this area have consisted primarily of lithographic patterning followed by random deposition10,11 or the electrostatic12 or magnetic13 trapping of nanostructures. However, these approaches all suffer from some deficiency: they do not provide precise positioning, require specific susceptibilities, have low throughput, and/or are not amenable to scaling. However, the capillary interaction at the solution interface has been demonstrated to play an important role in driving 2D or 3D crystallization14-16 and pattern formation17-20 of micrometer- or millimeter-sized objects and has the potential to be a flexible and high-throughput method. Polymer and * To whom correspondence should be addressed. E-mail: alivis@ uclink4.berkeley.edu. † University of California. ‡ Lawrence Berkeley National Laboratory. 10.1021/nl049488i CCC: $27.50 Published on Web 05/04/2004

© 2004 American Chemical Society

silica particles have been successfully organized into lithographically patterned templates18 by the capillary force, forming highly ordered structures, although the diameters of the particles are typically submicrometer. It is not obvious whether this approach can be effectively extended to the assembly of sub-50-nm and even sub-10nm-diameter particles necessary for observing interesting plasmonic and electronic properties because the capillary interaction strength decreases with diminishing object dimension and the randomizing effects of the thermal fluctuation energy (kT) become more significant. A theoretical prediction (ref 21) of the capillary interaction energy between two 2-nmdiameter particles with immersion configuration in water indicates that it is less than kT. Herein we report that in our scheme, by controlling the appropriate parameters, the capillary force can overcome the random thermal fluctuations to assemble very small nanostructures effectively. We show the reproducible organization of 50-, 8-, and 2-nm-diameter nanoparticles at precise locations on a chip and/or within a circuit. In addition, complex nanostructures such as nanotetrapods and nanostructures of a wide variety of materials are also assembled successfully. Last, we demonstrate the reproducible highyield fabrication of arrays of single-particle transistors by assembling nanoparticles into electrode gaps. These results imply that it will be possible to move from the study of individual nanoparticle transistors toward the study of arrays of electronically addressable nanoparticles. Our approach to the controlled assembly of nanostructures exploits capillary interactions with nanostructures at the

Figure 1. (A) Schematic illustrating the capillary force (Fc) assembly mechanism at the vapor-suspension-substrate threephase contact line. (Inset) Moving of the three-phase contact line is driven by evaporation in-house vacuum or by heating the solution to ∼60 °C. (B) SEM images of 50-nm-diameter Au nanoparticles forming arrays on a hole template substrate. (Inset) White-light scattering image of arrays of single 60-nm Ag nanoparticles. (C) Collection of SEM images of 50-nm particles in holes with different diameters. (D-I) SEM images of 50-nm Au nanoparticles in trenches with different widths or orientations. The templates in C (bottom inset), D, and F are patterned into 300-nm-thick SiOx, and the templates in other cases are patterned into polymer resist on top of the Au-coated Si substrate. After oxygen plasma, the depth of holes and trenches is ∼60 nm. (There is no oxygen plasma treatment in I.) The solution interface moving direction is from bottom to top in all cases. Scale bar: (B) 10 µm, (C) 500 nm, (D, E, H, I) 200 nm, (F) 400 nm, (G) 2 µm.

three-phase vapor-suspension-substrate contact line during controlled solvent evaporation.22 The basic process is illustrated in Figure 1A. Flat substrates are patterned with hole and trench templates using electron beam lithography and 1094

subsequently inserted vertically into a solution containing the nanostructures (Figure 1A inset). The evaporation of the solvent leads to the three-phase contact line moving slowly across the substrate. When the solution film thickness on the substrate is less than the height of the nanostructure, the solution-vapor interface deforms, and the resulting capillary force slides the nanostructure toward the thicker part of the solution and pushes the particle toward the substrate. The net result is that particles are selectively forced into the lithographically defined features as the evaporation zone passes over them but no particles are deposited on the surrounding areas. We note that controlling the contact angle is critical to getting a good assembly of sub-50-nm-diameter particles because it determines the direction of the capillary force and thus the strength of parallel and perpendicular components. The optimal assembly was obtained with the contact angle (see Figure 1 caption) controlled22 between 10 and 30°, which ensures a large force perpendicular to the substrate capable of overcoming thermal fluctuations and pushing particles into the templates while maintaining the effective sliding action, leading to highly efficient assembly. We first illustrate the flexibility of this approach using a nearly monodisperse 50-nm-diameter Au nanoparticle aqueous suspension and a Au-coated substrate with patterns in a polymer resist.22 These particles are in the size range of interesting plasmon properties and can be readily imaged by scanning electron microscopy (SEM). Low-magnification SEM images (Figure 1B) show that the nanoparticles are well organized into 50-nm-diameter hole templates forming single-particle regular arrays controlled precisely by the lithographic design over an area on the order of ∼100 × 100 µm2. White-light scattering (Figure 1B inset) on largearea single-particle arrays shows regular bright dots with a single color, confirming the high regularity and uniformity of the single-particle arrays. We emphasize that the area is limited only by the throughput of the electron beam lithography system: this method is applicable on the wafer scale using other types of lithography such as nanoimprint.23,24 There are three key features in this assembly approach: (1) The number of particles deposited in the hole can be controlled over a wide range by varying the ratio of the hole diameter to the diameter of the nanocrystals. For example, we could control the number of 50-nm-diameter nanoparticles in a single hole, from one to two to three or more simply by varying the diameter of the holes (Figure 1C starting from top) from 50, 100, and 110 nm to larger sizes. (2) The combination of self-assembly of particles in the holes and top-down patterning by lithography positions particles precisely into the template and covers multiple length scales in a hierarchical manner. The hole template spacings can be precisely controlled by lithography all the way from 100 nm to the macroscopic scale, and the particle separation and periodicity in a hole can be tuned with different particle sizes and/or core-shell particle structures. (3) This method has very high selectivity for organizing nanoparticles into holes versus other surfaces. To evaluate it in a quantitative way, we define the selectivity parameter by the ratio of the particle Nano Lett., Vol. 4, No. 6, 2004

density on these two surfaces. The statistics on a 100 × 100 µm2 area gives an extremely high selectivity of 104. Such a high selectivity is achieved without any additional cleaning steps11 to remove unwanted nanoparticles and is important for building highly regular arrays and complex structures via multistep processes. To test whether this assembly method is compatible with current nanoelectronic technology processing on SiOx-Si substrates, we patterned hole templates into a thick SiOx layer on top of Si and carried out the assembly process. Figure 1C (bottom inset) clearly demonstrates that nanoparticles were well organized into these templates, with results similar to those obtained with the Au-coated surface patterned with polymer resist. Moreover, the successful and highly selective assembly on the SiOx surface also confirms that the mechanism of assembly is due to the capillary forces and not to other interactions such as electrostatic or van der Waals forces between the nanoparticles and the substrate because these interactions will cause an indiscriminate deposition of nanoparticles both into hole templates and onto other surfaces. We notice that the orientations of the particle configuration in most of the holes appear to be random and do not show preferential alignment along the direction of motion of the liquid interface. This suggests that nanoparticles have the freedom to adjust their positions in the holes (Figure 1C). This behavior is different from submicrometer-sized spheres,18 and we believe that this is because nanoparticles have high mobility in solution and can rearrange their configurations according to the local conditions in the hole immediately after the solution contact line crosses over. We also implement this method in assembling nanoparticles into extended patterns, which is important for electronics and photonics requiring charge carriers or electromagnetic energy transport over some distance. Figure 1G shows a lowmagnification SEM image that demonstrates the close packing of nanoparticles along the whole length of all of the trenches, again with excellent selectivity for the unpatterned substrate area. The configuration can also be controlled by changing the geometric parameters (width, length) of the trenches. When the width of the trench is about the diameter of the nanoparticles, a single-particle chain is obtained (Figure 1D). When the width of the trench is between 1 or 2 times the diameter of the nanoparticles, zigzag-shaped particle chains form (Figure 1E). Chains with a width of several particles are obtained when the trenches are more than twice the nanoparticle diameter (Figure 1F). Because trenches provide a useful test of template anisotropy, we have evaluated the effect of the interface direction of motion with respect to the trench orientation. Trenches with orientations parallel, perpendicular, and 45° to the direction of motion were studied. The results (Figure 1D and inset) show that all orientations have a similar high yield and selectivity, with the relative orientation having no observable effect on assembly. These results are very important because they suggest that it is possible to have structures of arbitrary orientations that will permit the assembly of complex networks for functional applications with a single step. Nano Lett., Vol. 4, No. 6, 2004

Figure 2. (A-C) SEM images of 8-nm-diameter Au nanoparticles in trenches and holes. The substrates are SiOx. The depth of the trenches is ∼10 nm. (D-E) SEM images of 2-nm-diameter Au nanoparticles in trenches and holes. The substrates are polymer resist. The depth of the templates is ∼60 nm. The solution interface moving direction in all images is from bottom to top in all cases. Scale bars: (A) 1 µm, inset 50 nm, (B and C) 30 nm, (D) 2 µm, (E and F) 200 nm, (E) inset 50 nm, (F) inset 1 µm.

We have tested this capability by fabricating several different types of complex templates with lithography. After one-step assembly, nanoparticles are placed into complex patterns guided by the templates (as an example shown in Figure 1H). Moreover, this facile way of producing complex patterns can be further strengthened by tuning the substrate surface chemical functionality. For example (Figure 1I), by making trenches hydrophilic and the remaining surface hydrophobic, we are able to induce particles to decorate the edge of large trenches preferentially. This can be understood by considering the pinning of the liquid contact line at the wet trench edge combined with evaporation25 and the readjustment of nanoparticle positions after the liquid has crossed over the trenches. This is consistent with the previous observation regarding the random orientation of particle assemblies in round holes (Figure 1C). The highly successful organization of 50-nm-diameter nanoparticles has inspired us to explore the possibility of assembling macromolecule-sized nanostructures with diameters