SCHOEFFEL INSTRUMENT CORPORATION

analyzes thin layer media In all classical modes. Its background ... Physics", MIT Press, Cambridge, Mass.,. 1959. (7) U. Jecht and W. Kessler, Z. Ana...
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from g r o u n d s t a t e t r a n s i t i o n s . T h e fa­ cilities r e q u i r e d t o p r o d u c e such plas­ m a s are q u i t e inexpensive; C M P sys­ t e m s are available a n d M I P u n i t s can be a s s e m b l e d from c o m m e r c i a l com­ p o n e n t s . As i n d i c a t e d above, design c h a n g e s in t h e s a m p l e i n t r o d u c t i o n s y s t e m s a p p e a r a p p r o p r i a t e for t h e al­ leviation of s o m e interference p r o b ­ lems associated with t h e C M P . T h e d e m o n s t r a t e d sensitivity, selectivity, a n d universality of t h e M I P as a GC d e t e c t o r m a k e it an obvious choice over o t h e r t y p e s of selective d e t e c t o r s w i t h less universality. T h e sensitive m i c r o s a m p l e analysis capabilities of t h e M I P should also e n c o u r a g e its a d o p t i o n . Finally, t h e r e c e n t results on t h e use of t h e M I P as a multiele­ m e n t excitation source offer consider­ able p r o m i s e t h a t will surely encour­ age its f u r t h e r d e v e l o p m e n t .

Attention NMR Spectroscopics Tetramethylsilane, N M R grade guaranteed < 0 . 1 % total impurities downfield from T M S . Available from stock: 29200-3 Tetramethylsilane, N M R Grade 100g-$16.00; 500g-$72.00 11857-0 Hexamethyldisiloxane, N M R Grade 25g-$12.00; 100g-$21.50 N O T E : Minimum order $25.00

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Research Chemicals Division P.O. Box 1466/Gainesville, Florida 32602 (904) 376-7522 CIRCLE 173 ON READER SERVICE CARD

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Quantitation of TLC is much more accurate with an SD-3000 This d o u b l e - b e a m spectrodensitometer/ fluorometer rapidly and accurately analyzes thin layer media in all classical modes. Its background discriminating capability has made it the standard of R&D and quality control

24 Booker Street, Westwood. New Jersey 07675 (201) 664-7263

SCHOEFFEL INSTRUMENT CORPORATION

CIRCLE 187 ON READER SERVICE CARD 620 A · ANALYTICAL CHEMISTRY, VOL. 48, NO. 7, JUNE 1976

( 1 ) V. A. Fassel and R. N. Kniseley, Anal. Chem., 46, 1Π0Α (1974). (2) V. A. Fassel and R. N. Kniselev, ibid., pll55A. (3) G. F. Larson, V. A. Fassel, R. H. Scott, and R. N. Kniselev. ibid., 47, 238 (1975). (4) C. C. Butler, R. N. Kniselev, and V. A. Fassel, ibid., ρ 825. (5) V. A. Fassel, 0. A. Peterson, F. N. Abercrombie, and R. N. Kniselev. ibid., 48, 516(1976). (6) S. C. Brown, "Basic Data of Plasma Phvsics", MIT Press, Cambridge, Mass., 1959. (7) U. Jecht and W. Kessler, Z. Anal. Chem., 198,27 (1963). (8) U. Jecht and VV. Kessler, Z. Phvs., 178, 133(1964). (9) H. Goto, K. Hirokawa, and M. Suzuki, Fresenius Z. Anal. Chem., 225, 130 (1967). (10) S. Muravama. J. Appl. Phxs., 39, 5478 (1968). (11) M. Sermin, Analusis, 2,186(1973). (12) P.W..I.M. Boumans, F. J. DeBoer, F. J. Dahmen, H. Hoelzel. and A. Meier, Spectrochim. Acta, 30B, 449 (1975). (13) A. -J. McCormack, S. C. Tong, and W. I). Cooke, Anal. Chem., 37, 1470 (1965). (14) C. A. Bache and D. J. Lisk. ibid., ρ 1477. (15) C. A. Bache and I). J. Lisk, ibid., 38, 783(1966). (16) C. A. Bache and D.J. Li ibid., Ρ (17) C. A. Bache and D.J. Lis ibid., 39, 786(1967). (18) H. A. Move, ibid., ρ 1441. (19) J. H. Runnels and .1. H. Gibson, ibid., ρ 1398. (20) C. A. Bache and f). J. Lisk. ibid., 40, 2224 (1968). (21 ) C. A. Bache and D. J. Lisk, J. Cas Chromatogr., (1,301 (1968). (22) B. McCarrol, Rev. Sci. Instrum., 41, 279(1970). (23) C. A. Bache and D. J. Lisk, Anal. Chem., 43,950(1971). (24) F. E. Lichte and R. K. Skogerboe, ibid., 44, 1321 (1972). (25) F. E. Lichte and R. K. Skogerboe, ibid., μ 1480. (26) F. Ε. Lichte and R. K. Skogerboe, ibid., 45,399 (1973). (27) K. W. Busch and T. J. Vickers, Spectrochim. Acta, 28B, 85 (1973). (28) K. F. Fallgatter, V. Svoboda, and J. D. Winefordner, Appl. Spectrosc, 25, 347 (1971).