JEOL (USA) Inc. - Analytical Chemistry (ACS Publications)

May 29, 2012 - JEOL (USA) Inc. Anal. Chem. , 1983, 55 (3), pp 391A–391A. DOI: 10.1021/ac00254a741. Publication Date: March 1983. Copyright © 1983 ...
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High Sensitivity GC/MS with High Mass FAR JMS-DX300 ΕΙ/CI Double Focusing GC/MS • 25,000 resolution • Mass range to 3000 amu • Fast Atom Bombardment, Field Desorption, Field Ionization and Desorption Chemical Ionization • Multiple inlet capillary/packed column micro­ processor controlled GC • PDP-11/RSX-11M multi-tasking, multi-user, multi-instrument data system Computerized Selected Ion Monitoring El sensitivity of 50 picograms methyl stéarate injected with S/N > 10:1 for m/z = 298.3 J" | • Short ion path and three dimensional focusing for matchless sensitivity and resolution • High reliability, low downtime with continuous production • More than 300 units in use worldwide • Wide dynamic range For more information contact us a t . . . JEOL (USA) Inc. Analytical Instruments Division 235 Birchwood Avenue Cranford, Ν J 07016 (201)272-8820

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