Most sensitive and most easily used instrument for the analysis of trace impurities in solids. Particularly useful in such fields as: METALLURGY Rapid sample comparison Zone refining checks Quantitative trace impurity analysis Correlation of impurities with physical Pure metals research Investigation of special alloys
properties
•i '
SEMI-CONDUCTORS Raw materials analysis Measurement of impurity reduction after zone Examination of material in final manufacturing Checking doping of semi-conductors REACTOR
Analysis cross
refining stages
MATERIALS
of core, cladding and fuel material for the
section.
ΑΕΙ
MS7 MASS SPECTROMETER high sensitivity better than one part per billion for many elements
rapid analysis less than one hour to detect one part per billion; 15 minutes for one part per million
unifornci sensitivity ionization rate is essentially the same for all the elements
simple data presentation photoplates record all elements simultaneously
high resolution. double focusing separates background from trace element lines
The ΑΕΙ MS7 Mass Spectrometer is marked J hj us in the U.S.A. For details, call any local Picker office or write Picker X-Ray Corporation, White Plains, New York. Inquiries from areas outside the U.S.A. should be di rected to Associated Electrical Industries Export Ltd., Manchester, England, for prompt handling.
ease of operation.
Picker x-ray
does not require a highly trained technician Circle No. 149 on Readers' Service Card
VOL. 34, NO. 3, MARCH 1962
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