NEWS
ACS Program at ISA Meeting CHICAGO.—The joint ISA-ACS sym posium on "Continuous Analysis" held at the Instrument Society of America meeting in Chicago on September 23 covered the aspects of applicability, ad vantages, and pitfalls in the use of continuous analysis. The emphasis was away from instrumentation and was on the jobs that could be done and how best these jobs might be done, so that more of the advantages could be real ized and less of the pitfalls encountered. Dr. Sidney Siggia, Olin Mathieson Chemical Corp., program chairman, summed up the meeting with the thought that the most profitable man ner in utilizing advantages of contin uous analysis and avoiding the common pitfalls was to utilize the accumulated abilities of the plant chemists and engi neers, the analysts, and the instrument men. The plant chemists and engineers are the ones best qualified to state the de gree of control required by a given process—for example, the number of checkpoints to be monitored ; the num ber of components at each check point ;
and the frequency of analysis for each component at each check point. The analyst takes the program of control and decides which analytical ap proach—for example, ultraviolet ab sorption, mass spectrometry, gas den sity, titration, etc.—is best suited to yield the desired degree of control in the most efficient manner possible (be it continuous or noncontinuous analy sis). The instrument man takes the analyt ical program and selects, tests, and in stalls the instruments from the com mercially available devices best suited to do the necessary jobs. He evaluates facts such as applicability to the job, sturdiness in existing plant areas, ease of maintenance, costs, etc. With all this technology brought to play on a control program, the maxi mum advantages will be realized and the minimum in pitfalls encountered. In his paper, "Advantages and Pit falls in Continuous Analysis," Dr. H. J. Noebels, Beckman Instruments, indi cated how application engineering groups at the instrument companies op erate to gear a device to a proposed system. He emphasized that complete cooperation between the user of the instrument and the instrument com
VECO the ORIGINATOR
pany was necessary to ensure satisfac tory application of the purchased mon itoring device. Following Dr. Noebels' talk, there was a series of talks covering individual analytical approaches, their range of application and potential pitfalls. These talks included: Optical Absorp tion Methods for Continuous Analysis by R. L. Chapman, Beckman Instru ments, Inc.; Methods for Continuous Monitoring of Trace Oxygen by J. G. Cohn, Engelhard Industries, Inc.; Mass Spectrometry as Applied to Con tinuous Analysis by W. Bailey and R. Howard, Consolidated Electrodynamics Corp.; Vapor Fractometry as Applied to Continuous Analysis by H. J. Maier, Perkin-Elmer Corp.; Continuous Mon itoring of Viscosity by R. A. Minard, Brookfield Engineering Laboratories ; Automatic Colorimetric and Volumetric Analysis by S. P. Dodd, Chicago Ap paratus Co.; and Electrical Measure ment as Applied to Continuous Analy sis by R. M. Greene, The Foxboro Co. The ACS symposium was only one of approximately 60 technical sessions held at the 14th Annual ISA InstrumentAutomation Conference and Exhibit. The 5-day meeting, held September 21 to 25 at Chicago, was sponsored by the Instrument Society of America. In addition to the technical sessions there were instrumentation clinics, work shops, plant tours, and 400 or more ex hibits of new instruments and appa ratus. The ISA Analysis Instrumentation Division program included discussion of process chromatographs, process in frared analyzers and titrators. Japanese Exhibits. The first major effort on the part of Japan to enter the U. S. market with transistorized scien tific and industrial instruments and equipment was noted at the exhibit. Tokyo Shibaura Electric Co., Ltd., leading electric industrial company and Japan's largest manufacturer of trans istors, exhibited 10 transistorized meas uring instruments. These included selfbalancing recorders and indicators, radiation survey meters, and thermistor thermometers.
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ANALYTICAL CHEMISTRY
Mass Spectrometry Meeting The Eighth Annual Meeting of ASTM Committee E-14 on Mass Spec trometry will be held June 26 to July 1 in Atlantic City, N. J. Topics in mass spectrometry will include fundamental and applied research and development and analytical methods. Abstracts of papers should be sent to Dr. Vernon H. Dibeler, Mass Spec trometry Section, National Bureau of Standards, Washington 25, D. C , by February 1,1960.
